New Product » Design and Test
- Protect brand owners by ensuring quality expectations
- Optimize designs early on and lower the cost of test
- Decrease the Cost of Warranty by ensuring product performance
CIMTEK provides Design for Test (DFT) services to enable greater defect coverage, faster time-to-volume and lower cost of test, through specific approaches and techniques used during the design phase.
The growing complexities of integrated circuits and aggressive time-to-market requirements, coupled with the improvements in design quality that result from exploring high level tradeoffs, are driving the trend towards designing from behavioral and register transfer level (RTL) descriptions.
With test cost becoming an increasing component of the overall cost of manufacturing, it makes sense to integrate design with test as tightly as possible in order to significantly decrease your costs. Considering testability only during the lower level design steps can lead to significantly increased test overheads and reduced test quality. Test problems that cannot be fixed by lower level optimizations alone require additional design iterations leading to increased design cycles.
True benefits of high-level design cannot be fully realized unless consideration of testability is also integrated into the high-level design process.
Improving testability during the early stages of the design flow can have several benefits, including significantly improved fault coverage, reduced test hardware overheads, and reduced design iteration times.